Wang BoAssociate Professor

Institute of Instrument Science and Technology

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Quantum Metrology: Principle and Application

Release time:2022-04-07
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  Starting from the second half of the 20th century, with the development of precision measurement technology and quantum physics, metrology is facing a significant revolution -- replacing current international system of units (SI) defined in terms of material artifact by the natural quantum standards based on quantum physics. Up to now, for seven basic units, the quantum definition and reproduction of “second” and “meter” has been realized. The research on different quantum reproduction methods and devices of the other five basic units are still under research. It is believed that quantum standards will substitute for material ones completely in the future, and this will exert a profound impact on entire metrology field. Consequently, this course is designed for students to better adapt to this innovation in the metrology field. It will focus on the seven basic units and introduces the quantum metrology principle from the development of measurement and test methods to the next generation of SI, and from the quantum physics basis to quantum reproduction methods of seven basic units. Furthermore, it will introduce applications of quantum metrology techniques in certain large scientific or engineering facilities, such as very long baseline interferometry (VLBI), Square Kilometre Array telescope (SKA), Global Navigation Satellite System (GNSS), Laser Interferometer Gravitational-Wave Observatory (LIGO), Scanning Probe Microscope (SPM) and so on.